SN74BCT8374ADW - MFG Part Number

Description:
Texas Instruments Scan Test Device

Manufactured by Texas Instruments
Part Type: ICs
Datasheet: SN74BCT8374ADW - Datasheet (PDF)

Current Inventory In Stock: 150

Component Specific Details:
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

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Components

SN74BCT8374ADW - MFG Part Number

Representative Photos