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View All Inspection - X-Ray
X-Tek Systems XT V 160
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X-Tek Systems XT V 160
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X-Tek Systems XT V 160
IBE SMT Inventory ID : 260828-005
X-Tek Systems Serial Number : JN 2378
Vintage : 2012
Details
Microfocus X-ray System
X-Ray Source: 160kV 20W Nanotech TT
230V
Specifications ( See Details above for installed options )
The Nikon XT V 160 (formerly X-Tek Systems XT V 160) is a high-resolution, non-destructive X-ray and computed tomography (CT) inspection system designed for electronics manufacturing, printed circuit board (PCB) assemblies, and failure analysis laboratories.
Key Specifications & Features
• X-Ray Source: 160 kV micro-focus open-tube source with 20W true-target power and sub-micron feature recognition (1 µm focal spot size).
• Magnification & Angles: Over 2000x system magnification with 72° to 90° oblique angle inspection and full 360° rotation.
• Manipulation: 5-axis programmable sample manipulator controlled via a precision joystick.
• Sample Capacity: Accommodates trays up to 711 x 762 mm with a maximum sample weight of 5 kg.
• Software: Powered by Inspect-X software, featuring automated pass/fail reporting, C.Clear imaging, and a PCB Analysis Suite.
• Applications: Detecting dry joints, BGA voids, wire-bonding defects, and die-attach voiding in semiconductor and electronics production.
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